JEOL: Sales launch of HAXIS: The New Low-angle Ion Milling Scanning Electron Microscope
JEOL Ltd. (6951) will start selling its new low-angle ion-milling scanning electron microscope, HAXIS, on October 5, 2026. The device is designed for advanced semiconductor failure analysis, offering clear and reproducible passive voltage contrast (PVC) observation, minimizing sample damage, and reducing costs. JEOL aims to sell 15 units annually.

